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Applications Semiconductor

Semiconductor

Dicing, grooving and drilling of thin wafers and brittle materials with minimal chipping and debris. We are building process data with partners and would like to test your application.

[Photo: thin wafer after laser dicing]

[value] µm

Kerf width on [value] µm silicon.

[value] µm

Edge chipping after dicing.

[value] mm/s

Grooving speed on [material].

From problem to process

Thinner wafers, smaller dies. Less room for damage.

  1. 01 · Problem

    Blades chip, heat damages

    As wafers get thinner and dies smaller, blade dicing causes chipping and cracks. Longer-pulse lasers leave heat damage and debris that lower die strength and yield.

  2. 02 · Requirement

    What the process needs

    • Narrow kerf with minimal chipping
    • No heat damage to nearby structures
    • Clean processing with little debris
    • Throughput that fits fab cycle times
  3. 03 · Process

    Remove material without heat

    Femtosecond pulses ablate thin layers of silicon, low-k films and other materials before heat spreads, giving narrow, clean cuts and grooves on fragile wafers.

Why the architecture fits

Compact laser head

Integrates into wafer processing tools where space is limited.

Passive air cooling

No water lines near the wafer and fewer utilities in the fab.

Scales to multi-head

Add lasers to raise throughput without changing the process.

Simple integration

Standard interfaces for tool controllers and automation.

Evidence

Results from the application lab

Microscope images from LITILIT test runs. Every sample lists its material, thickness and magnification.

[Microscope image: diced wafer edge]
Diced wafer edge [Material], [thickness] mm, [value]× magnification
[Microscope image: groove cross-section]
Groove cross-section [Material], [thickness] mm, [value]× magnification
Case study

Partner project: [process]

We are running a joint process study with [partner] on [material]. Results will be published here once they are confirmed.

Read the case study

Typical process window

Starting parameters from our lab. Your material, thickness and design will move them, so we confirm every number on your own samples.

Materials
Silicon, SiC, sapphire, low-k films, [others]
Wafer thickness
[value] – [value] µm
Kerf width
[value] µm
Chipping
< [value] µm
Recommended wavelength
515 nm (Green, optional) or 1030 nm (IR)
Recommended laser
INDYLIT 20

Lasers for this application

The laser we recommend for this process.

INDYLIT 20 laser, view 1INDYLIT 20 laser, view 2INDYLIT 20 laser, view 3INDYLIT 20 laser, view 4

INDYLIT 20

Up to 20 W at 1 MHz, with an optional 515 nm green module, for wafer processing.

  • 380 fs pulses
  • 1030 / 515 nm
  • Passively air cooled

View INDYLIT 20

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High-quality marking

Test your wafers with us.

Send samples to our Vilnius application lab. We process them, share the results and parameters, and plan the next step with your team.

Discuss your application with an engineer.

Tell us the material and the result you need. A laser engineer replies within [response time].

Buying for production?

Ask about lead times, volume pricing, supply capacity and long-term availability.

Request a quote
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